Focus topic. FXE. Resolution but make it greater

April 20, 2026

As industrial components continue to reduce in size, X-ray inspection is crucial for detecting microscopic defects across a range of applications, from materials science to electronics failure analysis to biological samples. At the same time, obtaining high-quality data as quickly as possible so users can spend more time analyzing their data and producing actionable insights is also critical. This calls for high-power X-ray output and a stable, high-resolution beam. The FXE-160 Nano CT can rapidly examine sub-micron defects across a wide range of lab applications by leveraging external cooling and higher resolution.

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Interview with Pierre-Emmanuel Rigot, Technical & Customer Service at X-RIS

April 16, 2026

How Pierre-Emmanuel uses BLOX to reduce diagnosis delays, support preventive maintenance, and bring clarity to service decisions

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Interview with Rebecca Rudolph, General Manager at North Star Imaging

April 02, 2026

Across manufacturing and inspection, parts are becoming more complex, standards are tightening, and the pool of experts who know how to inspect them is shrinking.

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